"No-fault-found and intermittent failures in electronic products."

Haiyu Qi, Sanka Ganesan, Michael G. Pecht (2008)

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DOI: 10.1016/J.MICROREL.2008.02.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Haiyu Qi, Sanka Ganesan, Michael G. Pecht:
No-fault-found and intermittent failures in electronic products. Microelectron. Reliab. 48(5): 663-674 (2008)

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