"Application of transient interferometric mapping method for ESD and ..."

Dionyz Pogany et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2011.07.016

access: closed

type: Journal Article

metadata version: 2022-03-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PoganyBHMG11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PoganyBHMG11
Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik:
Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectron. Reliab. 51(9-11): 1592-1596 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.