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"Creep measurement and choice of creep laws for BGA assemblies' reliability ..."

S. Pin et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.029

access: closed

type: Journal Article

metadata version: 2020-02-22

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S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont:
Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. Microelectron. Reliab. 88-90: 1172-1176 (2018)

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