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"Impact of elevated temperature applied during low dose rate irradiation on ..."

Aleksandr S. Petrov et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.081

access: closed

type: Journal Article

metadata version: 2020-02-22

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Aleksandr S. Petrov, Konstantin I. Tapero, Viktor N. Ulimov, A. M. Chlenov:
Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers. Microelectron. Reliab. 88-90: 961-964 (2018)

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