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"Characterization and analysis of electrical trap related effects on the ..."

Sébastien Petitdidier et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.070

access: closed

type: Journal Article

metadata version: 2021-07-06

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Sébastien Petitdidier, Fanny Berthet, Yannick Guhel, Jean-Lionel Trolet, Philippe Mary, Christophe Gaquière, Bertrand Boudart:
Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. Microelectron. Reliab. 55(9-10): 1719-1723 (2015)

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