Stop the war!
Остановите войну!
for scientists:
default search action
"Measuring process capability based on CPK with gauge ..."
Wen Lea Pearn, Mou-Yuan Liao (2005)
- Wen Lea Pearn, Mou-Yuan Liao:
Measuring process capability based on CPK with gauge measurement errors. Microelectron. Reliab. 45(3-4): 739-751 (2005)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.