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"Long term storage reliability of antifuse field programmable gate arrays."
Nishad Patil et al. (2013)
- Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht:
Long term storage reliability of antifuse field programmable gate arrays. Microelectron. Reliab. 53(12): 2052-2056 (2013)
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