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"Experimental investigation of the reliability of Printed Circuit Board ..."

Yoann Pascal et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.064

access: closed

type: Journal Article

metadata version: 2020-12-29

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Yoann Pascal, Denis Labrousse, Mickael Petit, Stéphane Lefebvre, François Costa:
Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam. Microelectron. Reliab. 88-90: 707-714 (2018)

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