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"Failure analysis defect location on a real case 55 nm memory using dynamic ..."

Thierry Parrassin et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.056

access: closed

type: Journal Article

metadata version: 2020-02-22

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Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet:
Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. Microelectron. Reliab. 51(9-11): 1646-1651 (2011)

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