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"Mechanical stress-induced degradation model of amorphous InGaZnO thin film ..."

Chuntaek Park, Ilgu Yun (2017)

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DOI: 10.1016/J.MICROREL.2017.06.094

access: closed

type: Journal Article

metadata version: 2020-10-26

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Chuntaek Park, Ilgu Yun:
Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation. Microelectron. Reliab. 76-77: 592-595 (2017)

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