"Failure of electrical vias manufactured in thick-film technology when ..."

Dominique Ortolino et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.10.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dominique Ortolino, Jaroslaw Kita, Karin Beart, Roland Wurm, S. Kleinewig, A. Pletsch, Ralf Moos:
Failure of electrical vias manufactured in thick-film technology when loaded with short high current pulses. Microelectron. Reliab. 56: 121-128 (2016)

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