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"Integration-based approach to evaluate the sub-threshold slope of MOSFETs."
Adelmo Ortiz-Conde et al. (2010)
- Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho:
Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectron. Reliab. 50(2): 312-315 (2010)
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