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"Charge transport model to predict dielectric breakdown as a function of ..."

Sean P. Ogden et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.10.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sean P. Ogden, Yueming Xu, Kong Boon Yeap, Tian Shen, Toh-Ming Lu, Joel L. Plawsky:
Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness. Microelectron. Reliab. 91: 232-242 (2018)

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