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"Thermal stability of SiC Schottky diode anode and cathode metalisations ..."

Donagh O'Mahony et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.12.008

access: closed

type: Journal Article

metadata version: 2021-10-14

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Donagh O'Mahony, Russell Duane, Tony Campagno, Liam Lewis, Nicolás Cordero, Pleun Maaskant, Finbarr Waldron, Brian Corbett:
Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 °C. Microelectron. Reliab. 51(5): 904-908 (2011)

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