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"A compact test structure for characterisation of leakage currents in ..."

Zhenqiu Ning et al. (2001)

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DOI: 10.1016/S0026-2714(01)00100-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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Zhenqiu Ning, Yuri Sneyders, Wim Vanderbauwhede, Renaud Gillon, Marnix Tack, Paul Raes:
A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. Microelectron. Reliab. 41(12): 1939-1945 (2001)

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