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"Bias dependence of TID radiation responses of 0.13 μm partially ..."

Bingxu Ning et al. (2013)

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DOI: 10.1016/J.MICROREL.2012.08.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/NingBHZHCZ13
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou:
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. Microelectron. Reliab. 53(2): 259-264 (2013)

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