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"Decapsulation technique using electrochemical etching for failure analysis ..."

Takuya Naoe, Hirotaka Komoda (2012)

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DOI: 10.1016/J.MICROREL.2012.07.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Takuya Naoe, Hirotaka Komoda:
Decapsulation technique using electrochemical etching for failure analysis of WLCSP n-type Si assembled module devices. Microelectron. Reliab. 52(12): 3017-3021 (2012)

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