"Extraction of the trap distribution responsible for SILCs in MOS ..."

A. Nannipieri, Giuseppe Iannaccone, Felice Crupi (2004)

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DOI: 10.1016/J.MICROREL.2004.07.046

access: closed

type: Journal Article

metadata version: 2020-02-22

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A. Nannipieri, Giuseppe Iannaccone, Felice Crupi:
Extraction of the trap distribution responsible for SILCs in MOS structures from the measurements and simulations of DC and noise properties. Microelectron. Reliab. 44(9-11): 1497-1501 (2004)

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