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"Lot reliability issues in commercial off the shelf (COTS) microelectronic ..."

Giovanna Mura, Massimo Vanzi (2009)

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DOI: 10.1016/J.MICROREL.2009.06.042

access: closed

type: Journal Article

metadata version: 2023-03-21

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Giovanna Mura, Massimo Vanzi:
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectron. Reliab. 49(9-11): 1196-1199 (2009)

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