Stop the war!
Остановите войну!
for scientists:
default search action
"Dynamic simulation of migration induced failure mechanism in integrated ..."
Aymen Moujbani et al. (2013)
- Aymen Moujbani, Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein, Lutz Meinshausen:
Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects. Microelectron. Reliab. 53(9-11): 1365-1369 (2013)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.