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"Comparative study of thermal cycling and thermal shocks tests on ..."

Stéphane Moreau, Thierry Lequeu, Robert Jérisian (2004)

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DOI: 10.1016/J.MICROREL.2004.07.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Stéphane Moreau, Thierry Lequeu, Robert Jérisian:
Comparative study of thermal cycling and thermal shocks tests on electronic components reliability. Microelectron. Reliab. 44(9-11): 1343-1347 (2004)

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