
BibTeX record journals/mr/MoliereFPB09
@article{DBLP:journals/mr/MoliereFPB09, author = {F. Moli{\`{e}}re and B. Foucher and Philippe Perdu and Alain Bravaix}, title = {Analysis of deep submicron {VLSI} technological risks: {A} new qualification process for professional electronics}, journal = {Microelectron. Reliab.}, volume = {49}, number = {9-11}, pages = {1381--1385}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.07.001}, doi = {10.1016/j.microrel.2009.07.001}, timestamp = {Sat, 22 Feb 2020 19:26:53 +0100}, biburl = {https://dblp.org/rec/journals/mr/MoliereFPB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

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