BibTeX record journals/mr/MoliereFPB09

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@article{DBLP:journals/mr/MoliereFPB09,
  author    = {F. Moli{\`{e}}re and
               B. Foucher and
               Philippe Perdu and
               Alain Bravaix},
  title     = {Analysis of deep submicron {VLSI} technological risks: {A} new qualification
               process for professional electronics},
  journal   = {Microelectron. Reliab.},
  volume    = {49},
  number    = {9-11},
  pages     = {1381--1385},
  year      = {2009},
  url       = {https://doi.org/10.1016/j.microrel.2009.07.001},
  doi       = {10.1016/j.microrel.2009.07.001},
  timestamp = {Sat, 22 Feb 2020 19:26:53 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/MoliereFPB09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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