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"A study of electrical characteristic changes in MOSFET by electron beam ..."

Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee (2009)

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DOI: 10.1016/J.MICROREL.2009.07.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee:
A study of electrical characteristic changes in MOSFET by electron beam irradiation. Microelectron. Reliab. 49(9-11): 1182-1187 (2009)

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