"A function-fit model for the hard breakdown I-V characteristics of ..."

Enrique Miranda, B. Brandala (2005)

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DOI: 10.1016/J.MICROREL.2004.08.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Enrique Miranda, B. Brandala:
A function-fit model for the hard breakdown I-V characteristics of ultra-thin oxides in MOS structures. Microelectron. Reliab. 45(1): 175-178 (2005)

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