Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"In situ fixture for multi-modal characterization during electromigration ..."

James C. E. Mertens, Antony Kirubanandham, Nikhilesh Chawla (2015)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2015.08.003

access: closed

type: Journal Article

metadata version: 2022-04-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/MertensKC15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MertensKC15
James C. E. Mertens, Antony Kirubanandham, Nikhilesh Chawla:
In situ fixture for multi-modal characterization during electromigration and thermal testing of wire-like microscale specimens. Microelectron. Reliab. 55(11): 2345-2353 (2015)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.