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"Predictive evaluation of electrical characteristics of sub-22 nm FinFET ..."
Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis (2014)
- Cristina Meinhardt
, Alexandra L. Zimpeck, Ricardo A. L. Reis
:
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations. Microelectron. Reliab. 54(9-10): 2319-2324 (2014)
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