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"Development of an RF IV waveform based stress test procedure for use on ..."

William McGenn et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.09.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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William McGenn, Michael J. Uren, Johannes Benedikt, Paul J. Tasker:
Development of an RF IV waveform based stress test procedure for use on GaN HFETs. Microelectron. Reliab. 52(12): 2880-2883 (2012)

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