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"Automated Diagnosis and Probing Flow for Fast Fault Localization in IC."

D. Martin et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.057

access: closed

type: Journal Article

metadata version: 2020-02-22

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D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs:
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44(9-11): 1553-1558 (2004)

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