"SPICE modelling of hot-carrier degradation in ..."

Javier Martín-Martínez et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.150

access: closed

type: Journal Article

metadata version: 2020-02-22

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Javier Martín-Martínez, Esteve Amat, M. B. González, P. Verheyen, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Eddy Simoen:
SPICE modelling of hot-carrier degradation in Si_1-_xGe_x S/D and HfSiON based pMOS transistors. Microelectron. Reliab. 50(9-11): 1263-1266 (2010)

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