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"IV, noise and electroluminescence analysis of stress-induced percolation ..."

Paul Marko et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.030

access: closed

type: Journal Article

metadata version: 2024-05-07

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Paul Marko, Matteo Meneghini, Sergey Bychikhin, Denis Marcon, Gaudenzio Meneghesso, Enrico Zanoni, Dionyz Pogany:
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 52(9-10): 2194-2199 (2012)

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