"Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of ..."

M. Marin et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.02.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J. C. Vildeuil:
Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise. Microelectron. Reliab. 44(7): 1077-1085 (2004)

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