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"Characterisation and modelling of parasitic effects and failure mechanisms ..."

Nathalie Malbert et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.015

access: closed

type: Journal Article

metadata version: 2020-04-16

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  - https://dblp.org/rec/journals/mr/MalbertLCSHJDDDOBBC09
Nathalie Malbert, Nathalie Labat, Arnaud Curutchet, C. Sury, V. Hoel, J.-C. de Jaeger, Nicolas Defrance, Y. Douvry, Christian Dua, Mourad Oualli, C. Bru-Chevallier, Jean-Marie Bluet, W. Chikhaoui:
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs. Microelectron. Reliab. 49(9-11): 1216-1221 (2009)

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