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"An ESD test reduction method for complex devices."

Dejan M. Maksimovic et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.10.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/MaksimovicBNSK09
Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller:
An ESD test reduction method for complex devices. Microelectron. Reliab. 49(12): 1465-1469 (2009)

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