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"Improved single-pass approach for reliability analysis of digital ..."

Seyyed Javad Seyyed Mahdavi, Karim Mohammadi (2011)

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DOI: 10.1016/J.MICROREL.2010.08.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Seyyed Javad Seyyed Mahdavi, Karim Mohammadi:
Improved single-pass approach for reliability analysis of digital combinational circuits. Microelectron. Reliab. 51(2): 477-484 (2011)

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