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"Characterisation of defects generated during constant current ..."

Riko I. Made et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.072

access: closed

type: Journal Article

metadata version: 2023-05-22

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Riko I. Made, Yu Gao, Govindo J. Syaranamual, Wardhana A. Sasangka, L. Zhang, Xuan Sang Nguyen, Y. Y. Tay, Jason Scott Herrin, Carl V. Thompson, Chee Lip Gan:
Characterisation of defects generated during constant current InGaN-on-silicon LED operation. Microelectron. Reliab. 76-77: 561-565 (2017)

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