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"Study of RF N- LDMOS critical electrical parameter drifts after ..."

Hichame Maanane et al. (2006)

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DOI: 10.1016/J.MICROREL.2005.07.107

access: closed

type: Journal Article

metadata version: 2022-10-02

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Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, K. Ketata, Philippe Eudeline:
Study of RF N^- LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. Microelectron. Reliab. 46(5-6): 994-1000 (2006)

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