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"A percolation study of RTS noise amplitudes in nano-MOSFETs by Monte Carlo ..."
Zhongfa Ma et al. (2010)
- Zhongfa Ma, Peng Zhang, Yong Wu, Weihua Li, Yiqi Zhuang, Lei Du:
A percolation study of RTS noise amplitudes in nano-MOSFETs by Monte Carlo simulation. Microelectron. Reliab. 50(2): 179-182 (2010)
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