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"A run-time built-in approach of TID test in SRAM based FPGAs."

Ning Ma et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.128

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ning Ma, Shaojun Wang, Datong Liu, Yu Peng:
A run-time built-in approach of TID test in SRAM based FPGAs. Microelectron. Reliab. 64: 42-47 (2016)

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