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"Statistical model of NBTI and reliability simulation for analogue circuits."

Zhengliang Lv, Linda S. Milor, Shiyuan Yang (2012)

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DOI: 10.1016/J.MICROREL.2012.06.039

access: closed

type: Journal Article

metadata version: 2022-01-03

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Zhengliang Lv, Linda S. Milor, Shiyuan Yang:
Statistical model of NBTI and reliability simulation for analogue circuits. Microelectron. Reliab. 52(9-10): 1837-1842 (2012)

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