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"Markov process based reliability model for laser diodes in space radiation ..."

Yun Liu et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.08.006

access: closed

type: Journal Article

metadata version: 2023-03-07

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Yun Liu, Shanghong Zhao, Shengsheng Yang, Yongjun Li, Ruoxin Qiang:
Markov process based reliability model for laser diodes in space radiation environment. Microelectron. Reliab. 54(12): 2735-2739 (2014)

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