"Interconnect crosstalk noise evaluation in deep-submicron technologies."

Xiaoxiao Liu et al. (2009)

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DOI: 10.1016/J.MICROREL.2008.11.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xiaoxiao Liu, Guangsheng Ma, Jingbo Shao, Zhi Yang, Guanjun Wang:
Interconnect crosstalk noise evaluation in deep-submicron technologies. Microelectron. Reliab. 49(2): 170-177 (2009)

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