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"Comparing drop impact test method using strain gauge measurements."

Y. Liu et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Y. Liu, F. J. H. G. Kessels, Willem D. van Driel, J. A. S. van Driel, F. L. Sun, G. Q. Zhang:
Comparing drop impact test method using strain gauge measurements. Microelectron. Reliab. 49(9-11): 1299-1303 (2009)

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