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"Stress induced leakage current at low field in ultra thin oxides."
François Lime, Gérard Ghibaudo, G. Guégan (2001)
- François Lime, Gérard Ghibaudo, G. Guégan:
Stress induced leakage current at low field in ultra thin oxides. Microelectron. Reliab. 41(9-10): 1421-1425 (2001)
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