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"Scan chain failure analysis using laser voltage imaging."
Joy Y. Liao et al. (2010)
- Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng:
Scan chain failure analysis using laser voltage imaging. Microelectron. Reliab. 50(9-11): 1422-1426 (2010)
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