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"A prognostic methodology for power MOSFETs under thermal stress using echo ..."

Zhongliang Li, Zhixue Zheng, Rachid Outbib (2018)

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DOI: 10.1016/J.MICROREL.2018.07.137

access: closed

type: Journal Article

metadata version: 2020-02-22

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Zhongliang Li, Zhixue Zheng, Rachid Outbib:
A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter. Microelectron. Reliab. 88-90: 350-354 (2018)

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