"A Wiener process model for accelerated degradation analysis considering ..."

Junxing Li et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.08.004

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type: Journal Article

metadata version: 2021-07-29

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Junxing Li, Zhihua Wang, Xia Liu, Yongbo Zhang, Huimin Fu, Chengrui Liu:
A Wiener process model for accelerated degradation analysis considering measurement errors. Microelectron. Reliab. 65: 8-15 (2016)

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