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"Negative bias illumination stress instability in amorphous InGaZnO thin ..."

Jong Hoon Lee et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.036

access: closed

type: Journal Article

metadata version: 2022-04-21

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Jong Hoon Lee, Seul Ki Yu, Jae Won Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 580-584 (2016)

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