Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Device and circuit level suppression techniques for random-dopant-induced ..."

Kuo-Fu Lee et al. (2010)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2010.01.021

access: closed

type: Journal Article

metadata version: 2023-02-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LeeLLSH10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LeeLLSH10
Kuo-Fu Lee, Yiming Li, Tien-Yeh Li, Zhong-Cheng Su, Chin-Hong Hwang:
Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell. Microelectron. Reliab. 50(5): 647-651 (2010)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.