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"MOSFET channel resistance characterization from the triode region to ..."

Chie-In Lee, Wei-Cheng Lin (2015)

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DOI: 10.1016/J.MICROREL.2014.11.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chie-In Lee, Wei-Cheng Lin:
MOSFET channel resistance characterization from the triode region to impact ionization region with the inductive breakdown network. Microelectron. Reliab. 55(3-4): 481-485 (2015)

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