"The impact of PMOST bias-temperature degradation on logic circuit ..."

Yung-Huei Lee et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.05.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal R. Mielke, Ramez Nachman:
The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectron. Reliab. 45(1): 107-114 (2005)

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